UCC21330BQDRQ1 - Texas Instruments

Description: Universal: dual low-side, dual high-side or halfbridge driver • AEC-Q100 qualified with the following results – Device temperature grade 1 – Device HBM ESD classification level H2 – Device CDM ESD classification level C4B • Junction temperature range –40 to +150°C • Up to 4A peak source and 6A peak sink output • Common-mode transient immunity (CMTI) greater than 125V/ns • Up to 25V VDD output drive supply – 8V VDD UVLO options • Switching parameters: – 33ns typical propagation delay – 5ns maxi