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36502C47NJTDG - TE Connectivity

Description: TE Connectivity 3650 Series Wire-wound SMD Inductor 0.047 μH ±5% 1A Idc Q:65

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36502C47NJTDG - TE Connectivity PCB footprint - Inductors Chip - Inductors Chip - 36502C
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36502C47NJTDG - TE Connectivity  - 3D model - Inductors Chip - 36502C
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36502C47NJTDG Details

  • Manufacturer Part Number:

    36502C47NJTDG

  • Rohs Code:

    Yes

  • Part Life Cycle Code:

    Active

  • Package Description:

    CHIP, 1008

  • ECCN Code:

    EAR99

  • HTS Code:

    8504.50.80.00

  • Factory Lead Time:

    12 Weeks, 3 Days

  • Manufacturer:

    TE Connectivity

  • YTEOL:

    7.8

  • Case/Size Code:

    1008

  • Construction:

    Rectangular

  • DC Resistance:

    0.16 Ω

  • Inductance-Nom (L):

    0.047 µH

  • Inductor Application:

    RF INDUCTOR

  • Inductor Type:

    GENERAL PURPOSE INDUCTOR

  • Number of Functions:

    1

  • Number of Terminals:

    2

  • Operating Temperature-Max:

    125 °C

  • Operating Temperature-Min:

    -40 °C

  • Package Height:

    2.1 mm

  • Package Length:

    2.92 mm

  • Package Style:

    SMT

  • Package Width:

    2.79 mm

  • Packing Method:

    TR

  • Quality Factor-Min (at L-nom):

    65

  • Rated Current-Max:

    1 A

  • Self Resonance Frequency:

    1500 MHz

  • Shape/Size Description:

    RECTANGULAR PACKAGE

  • Shielded:

    NO

  • Special Feature:

    Q MEASURED AT 350 MHZ

  • Surface Mount:

    YES

  • Terminal Placement:

    DUAL ENDED

  • Terminal Shape:

    WRAPAROUND

  • Test Frequency:

    50 MHz

  • Tolerance:

    5%

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36502C47NJTDG Overview

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About TE Connectivity

TE Connectivity, a global leader in connectivity and sensor solutions, designs and manufactures products that enable a more connected world. Serving a diverse range of industries, including automotive, industrial, medical, aerospace, and telecommunications, TE Connectivity offers a broad portfolio of products such as connectors, sensors, relays, and passive components. The company's innovations help improve the reliability and performance of electronic systems.

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