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TH58NVG3S0HBAI4 - Toshiba

Description: NAND Flash 3.3V 8Gb 24nm SLC NAND (EEPROM)

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TH58NVG3S0HBAI4 - Toshiba PCB footprint - BGA - BGA - P-TFBGA63-0911-0.80CZ
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TH58NVG3S0HBAI4 - Toshiba  - 3D model - BGA - P-TFBGA63-0911-0.80CZ
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TH58NVG3S0HBAI4 Details

  • Manufacturer Part Number:

    TH58NVG3S0HBAI4

  • Part Life Cycle Code:

    Transferred

  • Package Description:

    BGA-63

  • ECCN Code:

    EAR99

  • HTS Code:

    8542.32.00.51

  • Manufacturer:

    Toshiba America Electronic Components

  • JESD-30 Code:

    R-PBGA-B63

  • Length:

    11 mm

  • Memory Density:

    8589934592 bit

  • Memory IC Type:

    FLASH

  • Memory Width:

    8

  • Number of Functions:

    1

  • Number of Terminals:

    63

  • Number of Words:

    1073741824 words

  • Number of Words Code:

    1000000000

  • Operating Mode:

    ASYNCHRONOUS

  • Operating Temperature-Max:

    85 °C

  • Operating Temperature-Min:

    -40 °C

  • Organization:

    1GX8

  • Package Body Material:

    PLASTIC/EPOXY

  • Package Code:

    BGA

  • Package Equivalence Code:

    BGA63,10X12,32

  • Package Shape:

    RECTANGULAR

  • Package Style:

    GRID ARRAY, VERY THIN PROFILE, FINE PITCH

  • Parallel/Serial:

    SERIAL

  • Programming Voltage:

    3.3 V

  • Seated Height-Max:

    1 mm

  • Supply Voltage-Max (Vsup):

    3.6 V

  • Supply Voltage-Min (Vsup):

    2.7 V

  • Supply Voltage-Nom (Vsup):

    3.3 V

  • Surface Mount:

    YES

  • Technology:

    CMOS

  • Temperature Grade:

    INDUSTRIAL

  • Terminal Form:

    BALL

  • Terminal Pitch:

    0.8 mm

  • Terminal Position:

    BOTTOM

  • Type:

    SLC NAND TYPE

  • Width:

    9 mm

  • Write Protection:

    HARDWARE

TH58NVG3S0HBAI4 Frequently Asked Questions (FAQs)

  • The recommended operating temperature range for the TH58NVG3S0HBAI4 is -40°C to 85°C.
  • The TH58NVG3S0HBAI4 has a built-in bad block management system. The device automatically detects and replaces bad blocks with spare blocks. However, it is recommended to implement additional error correction and bad block management mechanisms in the system design to ensure data integrity.
  • The TH58NVG3S0HBAI4 has a maximum of 3,000 program/erase cycles. It is recommended to implement wear leveling and garbage collection mechanisms to ensure the device's lifespan.
  • The TH58NVG3S0HBAI4 has a data retention period of 10 years at a temperature of 25°C. To ensure data retention, it is recommended to follow proper storage and handling procedures, and to implement data refresh mechanisms in the system design.
  • The recommended power-up sequence for the TH58NVG3S0HBAI4 is to apply VCC first, followed by VCCQ, and then the clock signal. It is also recommended to ensure that the power supply is stable and within the specified voltage range before accessing the device.

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TH58NVG3S0HBAI4 Overview

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