SN54SC6T17MPWTSEP - Texas Instruments

Description: Vendor item drawing available, VID V62/24619 • Total ionizing dose characterized at 30 krad (Si) – Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si) • Single-event effects (SEE) characterized: – Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg – Single event transient (SET) characterized to 43 MeV-cm2 /mg • Wide operating range of 1.2V to 5.5V • Single-supply translating gates at 5/3.3/2.5/1.8/1.2V VCC