SN54SC8T151MPWTSEP - Texas Instruments

Description: Vendor item drawing available, VID V62/25634-01XE • Radiation - Total Ionizing Dose (TID): – TID characterized up to 50krad(Si) – TID performance assurance up to 30krad(Si) – Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si) • Radiation - Single-Event Effects (SEE): – Single Event Latch-Up (SEL) immune up to 50MeV-cm2 /mg at 125°C – Single Event Transient (SET) characterized up to LET = 50MeV-cm2 /mg • Wide operating range of 1.2V to 5.5V