SN55HVD233-SEP - Texas Instruments
Description: VID V62/18617 • Radiation Hardened – Single Event Latch-up (SEL) Immune to 43 MeV-cm2 /mg at 125°C – ELDRS Free to 30 krad(Si) – Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 20 krad(Si)
Description: VID V62/18617 • Radiation Hardened – Single Event Latch-up (SEL) Immune to 43 MeV-cm2 /mg at 125°C – ELDRS Free to 30 krad(Si) – Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 20 krad(Si)
