SST26LF064-80-RT/SM-HP - Microchip

Description: Single Voltage Read and Write Operations: - 3.0V-3.6V • Radiation Tolerance Data: - Total dose: - Unbiased: 50 krad (Si) (Read) / 50 krad (Si) (Write) - Biased: 50 krad (Si) (Read) / 30 krad (Si) (Write) • Heavy Ion Single-Event Effects (SEE): - Single Event Upset (SEU) Rate < 3.33e-14 upsets/bit/day - Latch-up immunity > 62.5 MeV.cm2/mg (+125°C) • Serial Interface Architecture: - Nibble-wide multiplexed I/O’s with SPI-like serial command structure: - Mode 0 and Mode 3 - x1/x2/x4 Serial P