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9FGV0431AKLF - Renesas Electronics

Description: The 9FGV0431 is a 4-output very low power clock generator for PCIe Gen 1–4 applications. The device has 4 output enables for clock management and supports 2 different spread spectrum levels in addition to spread off.

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9FGV0431AKLF - Renesas Electronics PCB footprint - Quad Flat No-Lead - Quad Flat No-Lead - 32-pin VFQFPN2
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3D Models
9FGV0431AKLF - Renesas Electronics  - 3D model - Quad Flat No-Lead - 32-pin VFQFPN2
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9FGV0431AKLF Details

  • Manufacturer Part Number:

    9FGV0431AKLF

  • Brand Name:

    Renesas

  • Pbfree Code:

    Yes

  • Rohs Code:

    Yes

  • Part Life Cycle Code:

    Active

  • Part Package Code:

    VFQFPN

  • Pin Count:

    32

  • Manufacturer Package Code:

    NLG32P1

  • Country Of Origin:

    Malaysia

  • ECCN Code:

    EAR99

  • HTS Code:

    8542.39.00.01

  • Factory Lead Time:

    12 Weeks

  • Manufacturer:

    Renesas Electronics Corporation

  • YTEOL:

    15

  • Moisture Sensitivity Level:

    3

  • Peak Reflow Temperature (Cel):

    260

  • Qualification Status:

    Not Qualified

  • Terminal Finish:

    Matte Tin (Sn)

  • uPs/uCs/Peripheral ICs Type:

    CLOCK GENERATOR, PROCESSOR SPECIFIC

9FGV0431AKLF Frequently Asked Questions (FAQs)

  • Renesas provides a recommended PCB layout guide in their application note (R01AN4333EJ0100) which includes thermal design considerations, such as thermal vias, copper pours, and component placement.
  • Renesas recommends a specific power sequencing scheme in their application note (R01AN4333EJ0100) to ensure proper device operation. The sequence involves powering up the VCCIO, VCC, and VTT rails in a specific order.
  • The recommended PLL settings can be found in the Renesas FPGA development tool, Diamond, or in the device's datasheet. The settings include the PLL mode, frequency, and loop filter values.
  • Renesas provides power optimization techniques in their application note (R01AN4333EJ0100), including clock gating, voltage scaling, and dynamic voltage and frequency scaling (DVFS). Additionally, the device's power management features, such as the Power Manager (PM) and Dynamic Power Management (DPM), can be used to reduce power consumption.
  • The BIST feature has limitations, such as not testing all device resources, and may not detect all possible faults. Renesas recommends using the BIST feature in conjunction with other testing methods, such as JTAG boundary scan, to ensure comprehensive device testing.

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9FGV0431AKLF Overview

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