TH58NVG4S0FBAID footprint, schematic symbol and 3D model by Toshiba

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TH58NVG4S0FBAID Details

The recommended operating temperature range for the TH58NVG4S0FBAID is -40°C to 85°C.
The TH58NVG4S0FBAID has a built-in bad block management system. The device automatically detects and replaces bad blocks with spare blocks. However, it is recommended to implement additional error correction and bad block management mechanisms in the system design to ensure data integrity.
The TH58NVG4S0FBAID has a maximum of 3,000 program/erase cycles per block. It is recommended to implement wear leveling and garbage collection mechanisms to ensure even wear and extend the lifespan of the device.
The TH58NVG4S0FBAID supports secure erase through the use of the SECURE ERASE command. This command erases all data in the device and sets all bytes to 0xFF. It is recommended to use this command in conjunction with other security measures, such as encryption and access controls, to ensure data security.
The typical power consumption for the TH58NVG4S0FBAID is 50mA active read current, 30mA active write current, and 10mA standby current. However, actual power consumption may vary depending on the system design and operating conditions.

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