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FGI3040G2-F085 - onsemi

Description: Qualified to AEC Q101; Logic Level Gate Drive; RoHS Compliant; SCIS Energy = 300mJ at TJ = 25℃

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PCB Footprints
FGI3040G2-F085 - onsemi PCB footprint - Transistor Outline, Vertical - Transistor Outline, Vertical - I2PAK (TO−262 3 LD) CASE 418AV ISSUE A
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3D Models
FGI3040G2-F085 - onsemi  - 3D model - Transistor Outline, Vertical - I2PAK (TO−262 3 LD) CASE 418AV ISSUE A
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FGI3040G2-F085 Details

  • Manufacturer Part Number:

    FGI3040G2-F085

  • Brand Name:

    onsemi

  • Pbfree Code:

    Yes

  • Rohs Code:

    Yes

  • Part Life Cycle Code:

    Obsolete

  • Part Package Code:

    TO-262 3L (I2PAK)

  • Manufacturer Package Code:

    418AV

  • Reach Compliance Code:

    Not Compliant

  • Country Of Origin:

    Philippines

  • ECCN Code:

    EAR99

  • Factory Lead Time:

    16 Weeks

  • Manufacturer:

    onsemi

  • YTEOL:

    0

  • Collector Current-Max (IC):

    41 A

  • Collector-Emitter Voltage-Max:

    390 V

  • Fall Time-Max (tf):

    15000 ns

  • Gate-Emitter Thr Voltage-Max:

    2.2 V

  • Gate-Emitter Voltage-Max:

    12 V

  • Operating Temperature-Max:

    175 °C

  • Peak Reflow Temperature (Cel):

    NOT SPECIFIED

  • Polarity/Channel Type:

    N-CHANNEL

  • Power Dissipation-Max (Abs):

    150 W

  • Rise Time-Max (tr):

    7000 ns

  • Surface Mount:

    NO

  • Time@Peak Reflow Temperature-Max (s):

    NOT SPECIFIED

FGI3040G2-F085 Frequently Asked Questions (FAQs)

  • The recommended PCB layout and thermal management for optimal performance can be found in the onsemi application note AND9093/D, which provides guidelines for thermal design and layout considerations. Additionally, it's recommended to follow the JEDEC standard for thermal interface material and thermal pad design.
  • The FGI3040G2-F085 requires a specific biasing and configuration to operate optimally. Refer to the onsemi application note AND9094/D, which provides a detailed guide on biasing and configuration, including recommended voltage and current settings, and component selection.
  • The recommended test and measurement procedures for characterizing the FGI3040G2-F085's performance can be found in the onsemi application note AND9095/D, which provides guidelines for testing and measuring key parameters such as gain, noise figure, and linearity.
  • To prevent ESD damage, it's essential to follow proper handling and assembly procedures. Refer to the onsemi application note AND9096/D, which provides guidelines for ESD protection, including recommended handling and storage procedures, and ESD protection devices.
  • The FGI3040G2-F085 has undergone rigorous reliability and qualification tests, including temperature cycling, humidity testing, and electrical stress testing. Refer to the onsemi reliability report, which provides detailed information on the testing procedures and results.

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FGI3040G2-F085 Overview

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