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NVG800A75L4DSB2 - onsemi

Description: Half Bridge Dual-Side Cooling; Ultra-Low Stray Inductance; Tj_max = 175°C continuous operation; Low VCESAT and Switching losses; AQG324 Qualified FS4 750V Narrow Mesa IGBT; Smart On Chip Current and Temperature Sensor; Wirebond-Free Structure

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NVG800A75L4DSB2 - onsemi PCB footprint - Other - Other - NVG800A75L4DSB2-6
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NVG800A75L4DSB2 - onsemi  - 3D model - Other - NVG800A75L4DSB2-6
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NVG800A75L4DSB2 Details

  • Manufacturer Part Number:

    NVG800A75L4DSB2

  • Brand Name:

    onsemi

  • Pbfree Code:

    Yes

  • Rohs Code:

    Yes

  • Part Life Cycle Code:

    Active

  • Part Package Code:

    Gen II DSC AHPM15−CEC

  • Manufacturer Package Code:

    MODHV

  • Country Of Origin:

    Mainland China, Malaysia

  • ECCN Code:

    EAR99

  • Manufacturer:

    onsemi

NVG800A75L4DSB2 Frequently Asked Questions (FAQs)

  • The recommended PCB layout for optimal thermal performance involves using a 2-ounce copper layer, keeping the thermal vias as close as possible to the device, and using a solid copper pour on the top and bottom layers. Additionally, it's recommended to use a thermal pad on the bottom of the device and to connect it to a solid copper pour on the bottom layer.
  • To ensure reliable operation at high temperatures, it's essential to follow the recommended thermal design guidelines, including using a heat sink, ensuring good airflow, and keeping the junction temperature (Tj) below the maximum rated value of 150°C. Additionally, it's recommended to derate the device's power dissipation according to the temperature derating curve provided in the datasheet.
  • The critical parameters to monitor during operation to prevent premature failure include the junction temperature (Tj), input voltage (Vin), output voltage (Vout), output current (Iout), and power dissipation (Pd). It's also essential to monitor the device's operating frequency and ensure it's within the recommended range.
  • To troubleshoot issues related to electromagnetic interference (EMI), start by ensuring that the device is properly decoupled, and the PCB layout follows good EMI design practices. Check for proper grounding, shielding, and filtering of sensitive signals. Use EMI measurement tools, such as a spectrum analyzer, to identify the source of the interference and take corrective action.
  • The recommended testing and validation procedures for the NVG800A75L4DSB2 include functional testing, parametric testing, and environmental testing. Functional testing involves verifying the device's output voltage, output current, and switching frequency. Parametric testing involves measuring the device's electrical characteristics, such as input capacitance, output capacitance, and quiescent current. Environmental testing involves subjecting the device to various environmental stresses, such as temperature, humidity, and vibration.

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NVG800A75L4DSB2 Overview

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