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| Image | Part Number | D.S | Description | Package Category | Prices / Stock | Model | Action |
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805-160
Wago
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1 | PCB terminal block; push-button; 1.5 mm²; Pin spacing 3.5 mm; 10-pole; Push-in CAGE CLAMP®; with test port | Other | 805-160 |
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805-115
Wago
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1 | PCB terminal block; push-button; 1.5 mm²; Pin spacing 3.5 mm; 15-pole; Push-in CAGE CLAMP®; with test port | Other | 805-115 |
3
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805-113
Wago
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1 | PCB terminal block; push-button; 1.5 mm²; Pin spacing 3.5 mm; 13-pole; Push-in CAGE CLAMP®; with test port | Other | 805-113 |
3
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235-404/333-000
Wago
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1 | PCB terminal block; 2.5 mm²; Pin spacing 5/5.08 mm; 4-pole; PUSH WIRE®; with test port | Other | 235-404/333-000 |
3
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ISL6566CRZA-TR5184
Renesas Electronics
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1 | Switching Controllers IMPROVED OVP METAL CHANGE CUSTOM TEST | Quad Flat No-Lead | ISL6566CRZA-TR5184 |
3
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SN74LVTH182652APM
Texas Instruments
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1 | 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers | Quad Flat Packages | SN74LVTH182652APM |
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ST-1-2
Mac 8
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1 | Mac 8 Test Pin, Gold Over Nickel Plated Contact, Male | Other | ST-1-2 |
2
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74SSTUB32868ZRHR
Texas Instruments
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1 | 28-Bit to 56-Bit Registered Buffer with Address-Parity Test | BGA | 74SSTUB32868ZRHR |
3
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RCTCTE
KOA Speer
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1 | PC Test Point Steel Tin Plating Surface Mount Mounting Type | Other | RCTCTE |
3
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QFN11T040-004
Yamaichi
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1 | Yamaichi 0.5mm Pitch 40 Way Through Hole QFN Test Sockets | Other | QFN11T040-004 |
3
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5012
Keystone Electronics
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1 | KEYSTONE - 5012 - TEST POINT, PCB, THROUGH HOLE | Other | 5012 |
3
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S-5-A-16.4-G S/C
Smiths Interconnect
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1 | Contact Probes HEADED CUP 8 mOhms Test Leads, Banana Plugs, Alligator Clips & Test Probes Series: S-5 | Other | S-5-A-16.4-G S/C |
3
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36-6554-18
ARIES
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1 | IC & Component Sockets FORCE DIP TEST SCKT HIGH TEMP 36 PINSHEIGHT-25.03 | Other | 36-6554-18 |
3
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5024
Keystone Electronics
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1 | PC Test Point, Large Profile Phosphor Bronze Silver Plating Through Hole Mounting Type | Other | 5024 |
3
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SS-50-UT-2.9-G
Smiths Interconnect
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1 | Smiths Interconnect Americas, Inc. SS-50-UT-2.9-G Spring Test Probe, S/C SS-50 Series | Other | SS-50-UT-2.9-G |
3
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28-6554-11
ARIES
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1 | Aries Electronics 2.54mm Pitch 28 Way Through Hole Universal ZIF Test Socket | Other | 28-6554-11 |
3
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SN74SSTUB32866NMJR
Texas Instruments
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1 | Registers 25-Bit configurable registered buffer with address-parity test 96-NFBGA -40 to 85 | BGA | SN74SSTUB32866NMJR |
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SCAN921025HSM/NOPB
Texas Instruments
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1 | High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access | BGA | SCAN921025HSM/NOPB |
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24.243.1
Multicomp Pro
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1 | Banana Test Connector, 4mm, Socket, PCB Mount, 24 A, 60 VDC, Silver Plated Contacts, Red | Other | 24.243.1 |
3
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SS-50-A-2.9
Smiths Interconnect / IDI
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1 | 0.050” Centers Standard Spring Probes Board Test Fixture Probes & Receptacles | Other | SS-50-A-2.9 |
3
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SMT-0440-T-2-EB-R
PUI Audio
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1 | SMT-0440-T-2-R EVAL BOARDSMT-0440-T-2-R - Test and Measurement Evaluation Board | Other | SMT-0440-T-2-EB-R |
2
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M3498-99
Harwin
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1 | THT Right-Angle Test Receptacle for Ø2mm probe Red | Other | M3498-99 |
3
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44-6551-10
ARIES
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1 | IC & Component Sockets DIP TEST SCKT TIN 44 PINS | Other | 44-6551-10 |
2
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SN74ABT18504PM
Texas Instruments
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1 | Scan Test Devices With 20-Bit Universal Bus Transceivers | Quad Flat Packages | SN74ABT18504PM |
3
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74SSTUB32865ZJBR
Texas Instruments
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1 | 28-Bit to 56-Bit Registered Buffer with Address-Parity Test | BGA | 74SSTUB32865ZJBR |
3
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![Part Image](["https://componentsearchengine.com/2D/0/19202928.png",null,null])
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![Part Image](["https://componentsearchengine.com/2D/0/18971568.png",null,null])
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![Part Image](["https://componentsearchengine.com/Images/1/SN74LVTH182652APM.jpg",null,"//content.supplyframe.com/images/process/fit-in/100x100/p/2477_SN74LVTH182652A.jpg"])
![Part Image](["https://componentsearchengine.com/Images/3/ST-1-2.jpg",null,null])
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